Reliable TO3P / TO247-5L Aging Test Seats (Gold-Plated) Key benefits Reliable testing and programming of semiconductor devices for electronic engineers, manufacturers, and technicians. Gold-plated contacts provide strong antioxidation resistance for stable electrical connections and long-term reliability. Designed specifically for aging tests and burn-in in sockets, improving device longevity and functional stability before delivery or deployment. Easy to use in development labs, production lines, and repair centers — reduces handling time and repeat failures. What it does and why you need it Provides a dependable interface to seat TO3P and TO247-5L packaged components securely during functional tests, programming, burn-in, and life-cycle aging. Ensures consistent contact quality and minimizes oxidation-related contact issues that can cause intermittent failures or invalid test results. Helps screen defective parts early in the process, lowering field returns and increasing yield in mass production. Important attributes Compatibility: Specifically compatible with TO3P and TO247-5L semiconductor packages. Material: Gold-plated contact surfaces for enhanced corrosion resistance and stable conductivity. Function: Serves as an aging test seat/socket for burn-in, programming, functional verification, and screening. Performance: Stable electrical connection under extended test conditions; suitable for repeated insertions and removal cycles. Usability: Simple to install and operate in bench or production environments. Typical applications / use scenarios Development lab: Quickly program and validate power semiconductors and discrete devices during prototype testing and firmware updates. Production line burn-in: Integrate into mass-production test stations for automated or manual burn-in cycles to screen infant mortality and early-life failures. Repair and service center: Use for quick functional checks and screening of returned or repaired TO3P and TO247-5L components prior to reinstallation. Who should use it Electronic design and test engineers, contract manufacturers, PCB assembly lines, and repair facilities that require reliable, repeatable aging and burn-in testing for TO3P and TO247-5L devices. What to expect Consistent, low-resistance contacts throughout extended test cycles. Reduced contact corrosion and improved test reliability due to gold plating. A practical, lab-ready tool for improving test throughput and component quality control.